FAB Monitoring, factory data acquisition FDA

Your Eyes in the System
SEMI state models

Accurate knowledge of machine availability and production efficiency lays the foundation for a successful and continuous optimization process. But data acquisition today is often based on manually entered data. For accurate determination of the existing optimization potential, this approach is too imprecise.

So why not use a factory-wide monitoring system to automatically document the equipment state conditions and machine errors as well as calculate the key performance data?

Compare the efficiency of your machines

Direct coupling to the machine information allows automatic documentation and analysis of the data. This detailed evaluation helps you to lift the veil from production and your process becomes transparent.

Essential features at a glance:

Uniformity of machine information through standardisation
Consistent and complete acquisition of events, faults, throughput values and process values through automatic data acquisition
Online machine information (status, faults, products)
Offline evaluation, factory-wide reports
Equipment model construction based on machine status conditions and machine faults

Use our long years of experience. We support you with the facts for increasing production efficiency and equipment utilization and offer the Total Fab Monitoring tool.

Ad-hoc information:
The AIS is becoming part of
the Roth & Rau concern

SEMICON WEST
15. - 17. July 2008 in San Francisco (USA)

PVSEC
1. - 4. September 2008 in Valencia (Spain)

PSE
16. - 17. September 2008 in Garmisch-Patenkirchen

Innotrans
23. - 26. September 2008 in Berlin

SEMICON Europe
7. - 9. October 2008 in Stuttgart

SPS/IPC DRIVES
25. - 27. November 2008 in Nuremberg

AUTOMATICA
10. - 13. June 2008 in Munich

PV Technology Show
2. - 4. April 2008 in Munich

AEC/APC-Conference
31. March - 2. April 2008 Tel Aviv (Israel)

Silicon Saxony Day
18. - 19. March 2008 in Dresden

AIS Automation
Dresden GmbH